i2c_abuse_test.c File Reference

Total I2C Abuse: More...

#include "i2c_abuse_test.h"
#include "led.h"
#include "mcu_periph/i2c.h"

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Functions
void	init_i2c_abuse_test (void)
static void	i2c_abuse_send_transaction (uint8_t _init)
void	event_i2c_abuse_test (void)
void	periodic_50Hz_i2c_abuse_test (void)

Variables
struct i2c_transaction	i2c_test1
struct i2c_transaction	i2c_test2
volatile uint8_t	i2c_abuse_test_counter = 0
volatile uint32_t	i2c_abuse_test_bitrate = 1000

Detailed Description

Total I2C Abuse:

-all transaction types: T1 T2 T3 T4 R1 R2 R3 R4 T1R1 T2R1 T1R2 T1R3 T1R4 T1R5 T2R5 -all bitrates: 1k (way too slow) to 1M (way to fast) -occasional Short circuit (simulate bus capacitance or EMI errors) -variable bus load: from empty to full stack

-Connect LED to MosFet that pulls-down the SCL and SDA lines

Definition in file i2c_abuse_test.c.

Function Documentation

event_i2c_abuse_test()

void event_i2c_abuse_test

(

void

)

Definition at line 180 of file i2c_abuse_test.c.

References i2c_abuse_send_transaction(), i2c_abuse_test_bitrate, i2c_abuse_test_counter, i2c_idle(), i2c_setbitrate(), i2c_submit(), i2c_test1, i2c_test2, I2CTransFailed, I2CTransRx, I2CTransSuccess, LED_OFF, LED_ON, LED_TOGGLE, i2c_transaction::len_r, i2c_transaction::slave_addr, i2c_transaction::status, and i2c_transaction::type.

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i2c_abuse_send_transaction()

static void i2c_abuse_send_transaction ( uint8_t  _init )

static

Definition at line 60 of file i2c_abuse_test.c.

References i2c_transaction::buf, i2c_submit(), i2c_test1, I2CTransRx, I2CTransTx, I2CTransTxRx, i2c_transaction::len_r, i2c_transaction::len_w, i2c_transaction::slave_addr, and i2c_transaction::type.

Referenced by event_i2c_abuse_test().

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init_i2c_abuse_test()

void init_i2c_abuse_test

(

void

)

Definition at line 45 of file i2c_abuse_test.c.

References i2c_abuse_test_bitrate, i2c_abuse_test_counter, i2c_test1, i2c_test2, I2CTransSuccess, i2c_transaction::slave_addr, and i2c_transaction::status.

periodic_50Hz_i2c_abuse_test()

void periodic_50Hz_i2c_abuse_test

(

void

)

Definition at line 226 of file i2c_abuse_test.c.

Variable Documentation

i2c_abuse_test_bitrate

volatile uint32_t i2c_abuse_test_bitrate = 1000

Definition at line 43 of file i2c_abuse_test.c.

Referenced by event_i2c_abuse_test(), and init_i2c_abuse_test().

i2c_abuse_test_counter

volatile uint8_t i2c_abuse_test_counter = 0

Definition at line 42 of file i2c_abuse_test.c.

Referenced by event_i2c_abuse_test(), and init_i2c_abuse_test().

i2c_test1

struct i2c_transaction i2c_test1

Definition at line 1 of file i2c_abuse_test.c.

Referenced by event_i2c_abuse_test(), i2c_abuse_send_transaction(), and init_i2c_abuse_test().

i2c_test2

struct i2c_transaction i2c_test2

Definition at line 1 of file i2c_abuse_test.c.

Referenced by event_i2c_abuse_test(), and init_i2c_abuse_test().